Category: Heating and Biasing Electron Microscopy

Tuesday publication post! In this publication from the #TUBerlin and #HumboldtUniversityBerlin the authors have used a unique method for ultrafast time-resolved electron holography on electronic devices! Using iGate, authors Tolga Wagner, Husayin Celik, Michael Lehmann, Dirk Berger and Ines Häusler captured the switching behavior of two silicon diodes (unbiased to reverse-biased) with unprecedented 25 ns … Read More

Tuesday publication post! In this newest publication using the #FusionAX system, authors were using in situ electrical biasing within TEM to study electronic device formation! They visualized the formation of nanowires for field-effect transistors (FETs) in real time and at atomic resolution. The findings revealed that Mo₆Te₆ NWs form only along specific directions within the … Read More

Tuesday publication post! In this newest publication, the authors have looked at different ion beam milling techniques to make FIB lamella for electrical biasing with the #FusionAX system! When it comes to transmission electron microscopy (TEM) sampling, traditional Ga ion beam techniques often introduce damage, lowering the chemical stability of samples, particularly for metal thin … Read More

Tuesday publication post! In this publication from the #UniversityofMinnesota and #UniversityofArizona, the authors have used our #FusionAX to look at MRAM devices by doing electrical biasing in the electron microscope with atomic resolution! As computing technology advances, demand for efficient data storage solutions is growing. Spintronic magnetic tunnel junction (MTJ)-based MRAM devices are emerging as … Read More

Tuesday publication post! In this work, the #FusionAX system was used for electrothermal studies of high electron mobility transistors! Congratulations to this nice publication to Nahid Sultan Al-Mamun ,Ahmad Islam, Nicholas Glavin, Aman Haque, Douglas E.Wolfe, Fan Ren and Stephen Pearton! ️High-temperature operation is a critical factor impacting the reliability of AlGaN/GaN high electron mobility … Read More

Tuesday publication update! In this newest research published in #AdvancedMaterials, researchers are looking at all-electric functional nanodevices with rapid reset and multi-state switching capabilities using our #FusionAX system! Using an in situ biasing technique, and focus-ion beam preparation (FIB) the authors look at spin configuration rearrangement by domain wall number modulation in Fe3GeTe2. ⚡In-situ Lorentz … Read More