Synergistic Effects of Heating and Biasing of AlGaN/GaN High Electron Mobility Transistors: An In-Situ Transmission Electron Microscopy Study
Tuesday publication post! In this work, the #FusionAX system was used for electrothermal studies of high electron mobility transistors! Congratulations to this nice publication to Nahid Sultan Al-Mamun ,Ahmad Islam, Nicholas Glavin, Aman Haque, Douglas E.Wolfe, Fan Ren and Stephen Pearton! ️High-temperature operation is a critical factor impacting the reliability of AlGaN/GaN high electron mobility … Read More